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Conference Paper

Kuhn, A, Rompaey BV, Hänsenberger L, Nierstrasz O, Demeyer S, Gaelli M, Van Leemput K. 2008.
JExample: Exploiting Dependencies Between Tests to Improve Defect Localization.
Proceedings {XP}'08 (9th International Conference on Extreme Programming and Agile Processes in Software Engineering. Abstract